IEC 60749-36-2003 半导体器件.机械和气候试验方法.第36部分:稳态加速
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【英文标准名称】:Semiconductordevices-Mechanicalandclimatictestmethods-Part36:Acceleration,steadystate
【原文标准名称】:半导体器件.机械和气候试验方法.第36部分:稳态加速
【标准号】:IEC60749-36-2003
【标准状态】:现行
【国别】:国际
【发布日期】:2003-02
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/TC47
【标准类型】:()
【标准水平】:()
【中文主题词】:电子设备及元件;机械试验;半导体器件;试验;集成电路;环境试验;气候试验;电子工程;电学测量;加速度试验;元部件;气候;半导体;加速度;电气工程
【英文主题词】:Accelerate;Acceleratedtesting;Acceleration;Climate;Climatictests;Components;Destructivetesting;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Environmentaltesting;Integratedcircuits;Mechanicaltesting;Semiconductordevices;Semiconductors;Testing
【摘要】:ThispartofIEC60749providesatestfordeterminingtheeffectsofconstantaccelerationoncavity-typesemiconductordevices.Itisanacceleratedtestdesignedtoindicatetypesofstructuralandmechanicalweaknessesnotnecessarilydetectedinshockandvibrationtest.Itmaybeusedasahighstress(destructive)testtodeterminethemechanicallimitsofthepackage,internalmetallisationandleadsystem,dieorsubstrateattachment,andotherelementsofthemicroelectronicdevice.Whenproperstresslevelshavebeenestablishedthistestmethodmayalsobeemployedasanon-destructivein-line100%screentodetectandeliminatedeviceswithlowerthannormalmechanicalstrengthsinanyofthestructuralelements.Ingeneral,thisaccelerationsteady-statetestmethodisinconformitywithIEC60068-2-7but,duetospecificrequirementsofsemiconductors,theclausesofthisstandardapply.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:16P.;A4
【正文语种】:英语
【原文标准名称】:半导体器件.机械和气候试验方法.第36部分:稳态加速
【标准号】:IEC60749-36-2003
【标准状态】:现行
【国别】:国际
【发布日期】:2003-02
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/TC47
【标准类型】:()
【标准水平】:()
【中文主题词】:电子设备及元件;机械试验;半导体器件;试验;集成电路;环境试验;气候试验;电子工程;电学测量;加速度试验;元部件;气候;半导体;加速度;电气工程
【英文主题词】:Accelerate;Acceleratedtesting;Acceleration;Climate;Climatictests;Components;Destructivetesting;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Environmentaltesting;Integratedcircuits;Mechanicaltesting;Semiconductordevices;Semiconductors;Testing
【摘要】:ThispartofIEC60749providesatestfordeterminingtheeffectsofconstantaccelerationoncavity-typesemiconductordevices.Itisanacceleratedtestdesignedtoindicatetypesofstructuralandmechanicalweaknessesnotnecessarilydetectedinshockandvibrationtest.Itmaybeusedasahighstress(destructive)testtodeterminethemechanicallimitsofthepackage,internalmetallisationandleadsystem,dieorsubstrateattachment,andotherelementsofthemicroelectronicdevice.Whenproperstresslevelshavebeenestablishedthistestmethodmayalsobeemployedasanon-destructivein-line100%screentodetectandeliminatedeviceswithlowerthannormalmechanicalstrengthsinanyofthestructuralelements.Ingeneral,thisaccelerationsteady-statetestmethodisinconformitywithIEC60068-2-7but,duetospecificrequirementsofsemiconductors,theclausesofthisstandardapply.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:16P.;A4
【正文语种】:英语
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